 |

XL-30 Environmental Scanning Electron Microscope
The XL-30 Environmental Scanning Electron Microscope (ESEM) is a state
of the art high resolution research instrument. It has a field emission
electron gun (FEG) and can be operated in three vacuum modes, e.g., conventional
high vacuum, low vacuum and true environmental mode. These capabilities,
together with wide range of detector, make it possible to imaging almost
any sample with only exceptions of volatile liquids and gases.
The XL-30 ESEM is equipped various detectors, such as, secondary electron,
gaseous secondary electron, wide-field secondary electron detectors, back
scattered electron Detectors (GBSD and BSD) for both high vacuum and gaseous
environment. It is also attached by an EDS system (PGT) and an EBSD system
(HKL Technology).
[close
window]
|
 |